AFM Park NX10
Description
The AFM Park NX10 is an accurate atomic force microscope for nanotechnology.
The material characterization techniques of this tool include:
- Non-contact AFM
- Contact AFM
- Lateral force microscopy (LFM)
- Phase imaging
- Intermittent tapping
- Conductive AFM
- I-V spectroscopy
- Scanning Kelvin probe microscopy (SKPM)
- Electrostatic force microscopy (EFM) including dynamic contact (DC-EFM) and piezoresponse force microscopy (PFM)
Download the AFM Park NX10 Brochure (PDF version, 1,242 KB)
